Parametric Analysis on Irradiation Damage on Bipolar Transistors from Co Source

HAN Qiang, LI Xing-ji, YANG Jian-qun, MA Guo-liang, LIU Chao-ming ,HU Jian-min

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Industrial Technology Innovation ›› 2017, Vol. 4 ›› Issue (1) : 26-29. DOI: 10.14103/j.issn.2095-8412.2017.01.006

Parametric Analysis on Irradiation Damage on Bipolar Transistors from Co Source

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